Older Publications

Publications not listed in DiVA, the university's database over publications.

 Journal Articles

 
 N. Björsell, M. Isaksson, P. Händel, and D. Rönnow, “Kautz-Volterra modelling of analogue-to-digital converters," Computer Standards & Interfaces, Vol. 32, pp. 126—129, 2010.

 
 N. Björsell, P. Suchánek, P. Händel, and D. Rönnow, "Measuring Volterra kernels of analog to digital converters using a stepped three-tone scan," IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 4, pp. 666- 671, April 2008.  

 
D. Wisell, D. Rönnow, and P. Händel, “A Technique to Extend the Bandwidth of an RF Power Amplifier Test-bed," IEEE Transactions on Instrumentation and Measurements, Vol. 56, Issue 4, pp. 1488 — 1494 Aug. 2007. 
 
M. Isaksson and D. Rönnow, “A parameter-reduced Volterra model for Dynamic RF power amplifier modeling based on orthonormal basis functions," The International Journal of RF and Microwave Computer-Aided Engineering, Vol. 17, Issue 6, pp. 542-551, Nov. 2007.

 
D. Rönnow and M. Isaksson, “Digital predistortion of radio frequency power amplifiers using a Kautz-Volterra model," Electronics Letters, Vol. 42, No. 13, pp. 780-782, June 2006.

 
Xin Mei Feng, J. Olsson, M. Swanberg, J. Schnürer, and D. Rönnow, “Image analysis for monitoring the barley tempeh fermentation process," Journal of Applied Microbiology, Volume 103, Issue 4, Page 1113-1121, Oct 2007.

 
M Isaksson, D. Wisell, and d. Rönnow, “A comparative analysis of behavioral models for RF power amplifiers,“ IEEE Transactions on Microwave Theory and Techniques", vol. 54, No. 1, pp. 348-359, 2006. 

 
M Isaksson, D. Wisell, and d. Rönnow, “Wideband Dynamic Modeling of Power Amplifiers Using Radial-Basis Function Neural Networks, “ IEEE Transactions on Microwave Theory and Techniques, vol. 53, pp. 3422-3428, 2005.

 
D. Rönnow, D. Wisell, and M. Isaksson, “Characterization of Nonlinear Memory Effects in RF Power Amplifiers by Three Tone Measurements," IEEE Transactions on Instrumentation and Measurements, vol. 56, no. 6, pp. 2646-2657, 2007.

 
D. Wisell, B. Rudlund, and D. Rönnow, “Characterization of Memory Effects in Power Amplifiers Using Digital Two-Tone Measurements," IEEE Transactions on Instrumentation and Measurements, vol. 56, no.  6, pp. 2757-2766, 2007. 

 
D. Rönnow,E. Veszelei , S. Bruce, and J. Isidorsson, “Yttrium hydride layer with switchable microwave properties," Thin Solid Films, vol. 467,  (2004). 

 
L. F. Lastras-Martínez, D. Rönnow, P. V. Santos, M. Cardona, and K. Eberl, “Optical anisotropy of (001)-GaAs surface quantum wells," Physical Review B, vol. 63, 245303 (2001).

 
J. M. Bennett and D. Rönnow, “Test of Opticlean strip coating material for removing surface contamination," Applied Optics, vol. 39, pp. 2737 — 2739 (2000).

 
G. A. Niklasson, D. Rönnow, M. Strømme Mattsson, L. Kullman, H. Nilsson, and A. Roos, “Surface roughness of pyrolytic tin dioxide films evaluated by different methods," Thin Solid Films, vol. 359, pp. 203 — 209 (2000).

 
T. Lindström and D. Rönnow, “Total integrated scattering from transparent substrates in the infrared region: validity of scalar theory," Optical Engineering, vol. 39, pp. 478 - 487 (2000).

 
P. Nostell, A. Roos, and D. Rönnow, “Single beam integrating sphere spectrophotometer for R- and T-measurements versus angle of incidence in the solar wavelength range on diffuse and specular samples," Review of Scientific Instruments, vol.70, no.5, pp. 2481-2494 (1999).

 
D. Rönnow, N. E. Christensen, and M. Cardona, “Deformation potentials of the E1 transition in Ge, GaAs, InP, ZnSe, and ZnTe from ab-initio calculations," Physical Review B, vol. 59, no. 8, pp. 5575-5580 (1999).

 
D. Rönnow, M. Cardona, and L. F. Lastras-Martínez, “Piezo-optical coefficients of ZnSe and ZnTe above the fundamental gap," Physical Review B, vol. 59, no. 8, pp. 5581-5590 (1999).

 
D. Rönnow, L. F. Lastras-Martínez, M. Cardona, and P. V. Santos, “Determination of the piezo-optical properties of semiconductors above the fundamental gap by means of reflectance difference spectroscopy," Journal of the Optical Society of America A, vol. 16, no. 3, pp. 568 —573 (1999).

 
C. G. Granqvist, A. Azens, A. Hjelm, L. Kullman, G.A. Niklassson, D. Rönnow, M. Strømme-Mattsson, M. Veszelei, and G. Vaivars, “Recent advances in electrochromics for smart windows applications," Solar Energy, vol. 63, no. 4, pp. 199-216 (1998).

 
L. F. Lastras-Martínez, P. V. Santos, D. Rönnow, M. Cardona, P. Specht, and K. Eberl, “Reflectance Difference Spectroscopy of GaAs Assymmetric Surface Quantum Wells above the Fundamental Gap," physica status solidi (a), vol. 170, pp. 317-321 (1998).

 
D. Rönnow, L. F. Lastras-Martínez, and M. Cardona, “Isotope effects on the electronic critical points of germanium: Ellipsometric investigation of the E1 and E1+D1 transitions," European Physical Journal B, vol. 5, pp. 29-36 (1998).

D. Rönnow, P. Santos, M. Cardona, E. Anastassakis, and M. Kuball, “Piezo-Optics of InP in the Visible-Ultraviolet Range," Physical Review B, vol. 57, pp. 4432-4442 (1998) and Errata vol. 59, p. 2462 (1999).

 
D. Rönnow, T. Lindström, J. Isidorsson, and C. -G. Ribbing, “Surface Roughness of Oxidized Copper Films Studied by Atomic Force Microscopy and Spectroscopic Light Scattering," Thin Solid Films, vol. 325, pp. 92-98 (1998).

 
M. Cardona, D. Rönnow, and P. Santos, “Ellipsometric Investigations of Piezo-optical Effects," Thin Solid Films, vol. 313-314, pp. 10-17 (1998).

 
D. Rönnow, “Interface roughness statistics of thin films from angle resolved light scattering at three wavelengths," Optical Engineering, vol. 37, pp. 696-704 (1998).

 
D. Rönnow, T. Eisenhammer, and A. Roos, “Surface roughness characterisation of a thin transparent dielectric-silver tandem by spectroscopic light scattering,“ Solar Energy Materials and Solar Cells, vol. 52, pp. 37-43 (1998).

 
G. Granqvist, A. Azens, J. Isidorsson, M. Kharrazi, L. Kullman, T. Lindström, G.A. Niklasson, C. -G. Ribbing, D. Rönnow, M. Strømme-Mattsson, and M. Veszelei, “Towards the smart window: Progress in electrochromics," Journal of Non-Crystalline Solids, vol. 218, pp. 273-279 (1997).

 
T. Lindström, L. Kullman, D. Rönnow, C.-G. Ribbing, and C.G. Granqvist,  “Electrochromic control of thin film light scattering," Journal of Applied Physics, vol. 81, pp. 1464-1469 (1997).

 
D. Rönnow, “Determination of interface roughness cross-correlation of thin films from spectroscopic integrated light scattering measurements," Journal of Applied Physics, vol. 81, pp. 3627-3636 (1997).

 
D. Rönnow and J. Isidorsson, “Electrocrystallisation studied in situ by optical scattering," Solid State Communications, vol. 100, pp. 695-697 (1996) and Erratum vol. 101, p. 783 (1997).

 
C. G. Granqvist, A. Azens, L. Kullman, and D. Rönnow, “Progress in smart windows reserch: improved electrochromic W oxide films and transparent Ti-Ce oxide counter electrodes," Renewable Energy, vol. 8, pp. 97-106 (1996).

 
D. Rönnow, J. Isidorsson, and G.A. Niklasson, “Surface roughness of sputtered ZrO2 films investigated by atomic-force microscopy and spectroscopic light scattering," Physical Review E, vol. 54, pp. 4021-4026 (1996).

 
D. Rönnow, L. Kullman, and C.G. Granqvist, “Spectroscopic light scattering from electrochromic tungsten-oxide-based films," Journal of Applied Physics, vol. 80, pp. 423-430 (1996).

 
L. Kullman, D. Rönnow, and C.G. Granqvist, “Elastic light scattering and electrochemical durability of electrochromic tungsten-oxide-based films," Thin Solid Films, vol. 288, 330-333 (1996).

 
D. Rönnow, S.K. Andersson, and G.A. Niklasson, “Surface roughness effects in ellipsometry: comparison of truncated sphere and effective medium models," Optical Materials, vol. 4, pp. 815-821 (1995).

 
D. Rönnow and A. Roos, “Correction factors for reflectance and transmittance measurements of scattering samples in focusing Coblentz spheres and integrating spheres," Review of Scientific Instruments, vol. 66, pp. 2411-2422 (1995).

 
B. Lefez, K. Kaourtin, M. Lenglet, D. Rönnow, and C.G. Ribbing, “Application of reflectance spectrometry to the study of copper (I) oxides (Cu2O and Cu3O2) on metallic substrate," Surface and Interface Analysis, vol. 22, pp. 451-455 (1994).

 
D. Rönnow and A. Roos, “Diffuse reflectance and transmittance spectra of an interference layer: 2. Evaluation of tin oxide coated glass" Applied Optics, vol. 33, pp. 7918-7927 (1994).

 
A. Roos and D. Rönnow, “Diffuse reflectance and transmittance spectra of an interference layer: 1. Model formulation and properties," Applied Optics, vol. 33, pp. 7908-7917 (1994).

 
D. Rönnow and E. Veszelei, “Design review of an instrument for spectroscopic total integrated light scattering measurements in the visible wavelength range," Review of Scientific Instruments, vol. 65, pp. 327-334 (1994).

 
D. Rönnow and A. Roos, “Stray light corrections in integrating sphere measurements on low scattering samples," Applied Optics, vol. 33, pp. 6092-6097 (1994).

 
D. Rönnow, M. Bergkvist, A. Roos, and C. -G. Ribbing, “Determination of interface roughness by using a spectroscopic total-integrated-scatter instrument," Applied Optics, vol. 32, pp. 3448-351 (1993).

 
D. Rönnow, M. Bergkvist, A. Roos, and C. -G. Ribbing, “Interface roughness growth during oxidation analyzed with optical reflectance spectroscopy," Editions de la Révue de Metallurgie, vol. 6, pp. 173-178 (1992).

 
D. Rönnow, A. Roos, M. Wautelet, F. Hanus, and M. Bergkvist, “Laser vs. thermally induced oxidation of copper film," Editions de la Révue de Metallurgie, vol. 6, pp. 239-245 (1992).

 

 

Thesis

 
D. Rönnow, “Elastic Light Scattering by Thin Films: Spectroscopic Measurements and Analysis," Doctoral Thesis, UppsalaUniversity, 1996.

 

 
Conference Contributions

 
D. Rönnow, K. O´Connell, Qinglin Liu, J. Sørli, F. Maissant, T. Heesom,  “Instrument test in a point-receiver land seismic system," Expanded Abstracts,  Society of Exploration Geophysicists Annual Meeting, Denver, CO, USA, Oct. 2010, pp. 127 - 131.

 
N. Björsell, M. Isaksson, P. Händel, D Rönnow, “Kautz-Volterra modelling of an analogue-to-digital converter using a stepped three tone excitation," presented at the IMEKO 12th Workshop onADCmodeling and Testing, Iasi, Romania, 2007.

 
M. Isaksson, D. Wisell, A. Eng, and D. Rönnow, “A Study of a Variable-Capacitance Drain Network's Influence on Dynamic Behavioral Modeling of an RF PA," presented at the 69th ARFTG conference, Honolulu ,HI ,USA, June, 2007.  

 
D. Wisell, M. Isaksson, N. Keskitalo, and D. Rönnow, “Wideband characterization of a Doherty amplifier using behavioral modeling,"  Proc. 67th ARFTG Conf. Dig.   Pp. 190-199, San Francisco ,CA, June 2006.

 
M. Isaksson and D. Rönnow, “A Kautz-Volterra Behavioral Model for RF Power Amplifiers," Proc. of IEEE MTT-S Int. Microwave Symp. Dig., pp. 485-488, San Francisco ,CA, June 2006

 
D. Wisell, D. Rönnow, and P. Händel, “A bandwidth extension technique for dynamic characterization of power amplifiers," Proceedings 2006 IEEE Instrumentation and Measurement Technology Conference, pp. 1172-1175,  Sorrento, Italy, April 2006.
 
N. Björsell, D. Rönnow, and P. Händel, “Measuring Volterra kernels of analog to digital converters using a stepped three-tone scan," Proceedings IEEE Instrumentation and Measurement Technology Conference vol. 1, pp. 1047-1050,

Sorrento ,Italy, April 2006.

 
D. Wisell, M. Isaksson, and D. Rönnow, “Behavioral amplifier modelling using sampled complex envelope measurement data," Proc. Gigahertz 2005, Uppsala, Sweden, November 8 — 9, 2005.

 
J.V. Salinas Perez, F. Garcia Romero, D. Rönnow, A. Söderbärg, and T. Olsson, “A micro-strip passive inter-modulation test set-up; comparison of leaded and lead-free soldiers and conductor finishing," presented at MULCOPIM 2005,  ESTEC, The Netherlands,September 12 — 14, 2005 .

 
D. Wisell, M. Isaksson, and D. Rönnow, “Validation of Behavioural Power Amplifier Models Using Coherent Averaging," Proc. Gigahertz 2005, Uppsala ,Sweden,November 8 — 9, 2005 .

 
M. Isaksson, D. Wisell, and D. Rönnow, “Non-linear Behavioral Modeling of Power Amplifiers Using Radial-Basis Function Neural Networks," presented at IEEE International Microwave Symposium, MTT-S, Long Beach ,CA, June 2005.

 
D. Rönnow, “Measurement, analysis, modelling, and digital predistortion of RF/microwave power amplifiers," Paper presented ar GigaHertz 2003, Linköping ,Sweden,November 4-5, 2003(http://www.ep.liu.se/ecp/008/)  (invited).

 
M. Appelgren, D. Rönnow, P. Eriksson, and M. Danestig, “Impact of the use of adaptive and sector antennas on W-LAN performance," Paper presented at Antenn03 Nordic Antenna Symposium, Kalmar ,Sweden, May 2003.

 
D. Rönnow, L. F. Lastras-Martínez, M. Cardona, and P. V. Santos,  “Piezo-optical properties of ZnSe and ZnTe above the fundamental gap studied by reflectance difference spectroscopy," In Proc. 24th Int. Conf. Phys. Semicond (ICPS 1998), edited by D. Gershoni (World Scientific, Singapore, 1999), IX-B-34 (1323.pdf), 4 pages.  (paper presented at the 24:th International Conference on the Physics of Semiconductors, Jerusalem ,Israel,August 2-7, 1998 .)

 
D. Rönnow, P. Santos, E. Anastassakis, M. Kuball, and M. Cardona, “Piezo-Optics of InP in the Visible-Ultraviolet Range" Paper presented at Deutsche Physikalische Gesellschaft Früjahrstagung, Münster, Germany, 17-21 March 1997. In Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe VI, Band 32 (1997).

 
J. Isidorsson, D. Rönnow, C.G. Granqvist, and L. Nyholm, “Electrochemical Deposition on Tin Oxide Surfaces in LiClO4/Propylene Carbonate," Proceedings of the third symposium on Electrochromic Materials, Ed. K-C. Ho, C. B. Greenberg and D. M. MacArthur, Electrochemical Society Proceedings Volume 96-24, pp. 180-190, (1996).

 
L. Kullman, D. Rönnow, T. Lindström, and C. -G. Ribbing, “Spectroscopic light scattering investigation of electrochromic films and devices," Proc SPIE, vol. 3060 (1997). 

 
D. Rönnow and A. Roos, “Optical characterization of interface roughness of thin films on transparent substrates," Proc. SPIE vol. 2253, pp. 1050-1059 (1994).

 
D. Rönnow, “Sources of error in spectroscopic, low level integrated light scattering measurements," Proc. SPIE vol. 1995, pp. 143-151 (1993).

 
D. Rönnow, M. Bergkvist, A. Roos, “Spektrala ljusspridningsmatningarav interferensskikt," Paper presented at Optik-Teknik-Dagar, Stockholm, Oct. 1992. Published in Optik i Sverige, sammanfattningar av bidragen till Svenska Optiksallskapets forsta konferens.

 
D. Rönnow, M. Bergkvist, A. Roos, and C.-G. Ribbing, “Determination of interface roughness using a wavelength scanningTIS instrument," paper presented at the OSA First topical Meeting ion Surface Roughness and Light Scattering, Tucson ,USA,June 1-3, 1992 . Published in 1992 Technical Digest Series, vol. 14.

 

 

 

Patents

 

 
 Qinglin Liu, D. Rönnow, K. Iranpour, “Using Seismic Sensor Transfer Functions for High Fidelity Seismic Imaging,"  Patent US20110222371

 
D. Rönnow, “String of Sensor Assemblies Having a Seismic Sensor and Pressure Sensor," Patent US20110085417

 
VI. D. Rönnow, Qinglin Liu, J. Sørli, E. Kragh, P. Edme, and E. Muyzert, “Sensor Assembly having a seismic sensor, pressure sensor, and processor to apply first and second digital filters," Patent US20110085419

 
D. Rönnow, “Testing a sensor to produce a filter for noise attenuation," Patent WO2009051883

 
F. Maissant, D. Rönnow, and S. Barakat, “Determining a characteristic of a seismic sensing module using a processor in the seismic module," Patent WO2009055117

 
D. Rönnow, E. Veszelei, J. Isidorsson, and S. Bruce, “Microwave switching method and device," Patent WO2004077672 (2004). [“Förfarande och anordning för mikrovågsomkoppling," Patent SE0300536 (2003)]

 

 

 

 

Reports

 
A Johansson, M Isaksson, D Rönnow, “An Analysis of Kautz-Volterra models for modeling block structure nonlinear systems," Working Paper 43, University of Gävle, Gävle, Sweden, 2010.

 
D. Rönnow " Software for determining the third order Volterra kernels of radio frequency power amplifiers" Working Paper 33, University of Gävle, Gävle, Sweden, 2005.

 
L. Kullman, T. Lindström, D. Rönnow, and A. Roos, “Optical characterisation of electrochromic windows from Asahi Glass Co. Ltd and Gentex Corporation," in IEA Solar Heating and Cooling Programme, Task 18: Advanced Glazing and Associated Materials for Solar and Building Applications: B11 Optical Properties and Scattering, February 1996, T18/B3/SW4/96.

 
L. Kullman, D. Rönnow, and A. Roos, “Spectroscopic light scattering measurements of some electrochromic Tungsten-Oxide Samples," in IEA Solar Heating and Cooling Program, Task 18: Advanced Glazing and Associated Materials for Solar and Building Applications: B11 Optical Properties and Scattering, February 1996, T18/B3/SW2/96.

 
D. Rönnow, “Spectroscopic light scattering measurements using focusing and integrating spheres," UPTEC 94079R, licentiate treatise, UppsalaUniversity, Uppsala, 1994.

 
D. Rönnow and A. Roos, “Optical characterization of interface roughness of tin oxide coated glass substrates," in IEA Solar Heating and Cooling Program, Task 18: Advanced glazing and Associated Materials for Solar and Building Applications: B11 Optical Properties and Scattering, June 1993, T18/B11/SW8/94.

 
A. Roos and D. Rönnow, “Description of an absolute spectrophotometer for reflectance and transmittance measurements of transparent samples at oblique incidence," in IEA Solar Heating and Cooling Program, Task 18: Advanced Glazing and Associated Materials for Solar and Building Applications: B11 Optical Properties and Scattering, June 1993, T18/B11/SW7/94.

 
D. Rönnow and A. Roos, “Optical characterization of low scattering samples in an integrating sphere," in IEA Solar Heating and Cooling Program, Task 18: Advanced Glazing and Associated Materials for Solar and Building Applications: B11 Optical Properties and Scattering, June 1993, T18/B11/SW3/94.

 
D. Rönnow, “Comments on ellipsometry and light scattering techniques for surface roughness characterization," UPTEC 92120R, UppsalaUniversity, Uppsala, 1992.

 
D. Rönnow, “Construction and evaluation of a spectral TIS instrument," UPTEC 911093E, Diploma Work, UppsalaUniversity, Uppsala, 1991.

Publicerad av: Camilla Haglund Sidansvarig: Gunilla Mårtensson Sidan uppdaterades: 2016-11-17
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